Infrared reflection spectra of Hg1 − xZnxTe crystals

Hg1−xZnxTe crystals were grown by the traveling heater method. The composition and crystalline quality of ingots were analyzed by electrolyte electro-reflectance experiment. The far-infrared reflection spectra of Hg1−xZnxTe crystals with various composition x were measured at temperatures ranging from 90 K to 295 K in the wavenumber region of 60 to 450 cm−1. In all but the pure compounds, HgTe and ZnTe, a two TO phonon structure was clearly observed. The optical phonon frequencies were well-determined by both the Kramers-Krönig integrations and the dynamic dielectric function fitting, and their temperature dependence is discussed.