Title of article :
Influence of laser and isothermal treatments on microstructural properties of SnO2 films
Author/Authors :
Rembeza، نويسنده , , E.S. and Richard، نويسنده , , O. Van Landuyt، نويسنده , , J.Van، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
7
From page :
1527
To page :
1533
Abstract :
SnO2 thin films doped with Sb (ca. 3%) were deposited on glass and silicon substrates by magnetron sputtering and heat-treated by laser or isothermal treatment. The films were characterized for their composition, morphology, and crystalline structure by X-ray diffraction (XRD) and transmission electron microscopy (TEM). It was found that the tin oxide films consisted only of the SnO2 tetragonal phase; they were well crystallized and no microstructural defects were observed. The average grain size of the laser-treated films was approximately 6.3–8.9 nm, which is 2 times smaller than the grain size of the isothermally treated films.
Keywords :
A. Thin films , C. Electron microscopy , D. Microstructure , C. X-ray diffraction
Journal title :
Materials Research Bulletin
Serial Year :
1999
Journal title :
Materials Research Bulletin
Record number :
2094511
Link To Document :
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