Title of article :
Structural and electrical characterization of Bi5Ti3Fe1–xMnxO15 system
Author/Authors :
Ahn، نويسنده , , Sung-lak and Noguchi، نويسنده , , Yuji and Miyayama، نويسنده , , Masaru and Kudo، نويسنده , , Tetsuichi، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
10
From page :
825
To page :
834
Abstract :
Solid solutions in bismuth layer structured Bi5Ti3Fe1–xMnxO15 (x = 0–1) system were prepared, and evaluations of crystal structure and electrical properties were performed. Polycrystalline samples were synthesized by the solid-state reaction technique using component oxides, and their powder X-ray diffraction (XRD) patterns were analyzed by the Rietveld method using the RIETAN program. The Bi5Ti3FeO15 structure was maintained in the region of 0 ≤ x ≤ 0.4, but a structural change was suggested at x ≥ 0.5. The substitution of Fe3+ site by Mn3+ ion in Bi5Ti3FeO15 was found to shift the Curie temperature Tc toward the low-temperature region and to decrease the dielectric permittivity at Tc in the region of 0 ≤ x ≤ 0.4. The relationship between atomic displacement of B site ions (Ti4+, Fe3+, Mn3+) and the Curie temperature is discussed.
Keywords :
A. Layered compounds , D. Crystal structure , D. Dielectric properties , D. Phase transitions
Journal title :
Materials Research Bulletin
Serial Year :
2000
Journal title :
Materials Research Bulletin
Record number :
2094847
Link To Document :
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