Title of article
Preparation and X-ray characterization of low-temperature phases of R2SiO5 (R = rare earth elements)
Author/Authors
Wang، نويسنده , , Jiaguo and Tian، نويسنده , , Shujian and Li، نويسنده , , Guobao and Liao، نويسنده , , Fuhui and Jing، نويسنده , , Xiping، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
7
From page
1855
To page
1861
Abstract
Low-temperature phases of R2SiO5 (R = Y, Tb, Dy, Ho, Er, Tm, and Yb) were synthesized by the sol-gel method. The X-ray powder diffraction patterns for these new phases were indexed with the monoclinic unit cell, and the unit cell parameters were refined. The structure of Y2SiO5 with the space group P21/c was determined by powder diffraction data.
Keywords
A. Oxides , B. sol-gel chemistry , C. X-ray diffraction
Journal title
Materials Research Bulletin
Serial Year
2001
Journal title
Materials Research Bulletin
Record number
2095430
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