Title of article
Chemical imaging of interfaces by sum-frequency generation
Author/Authors
Flِrsheimer، نويسنده , , Mathias and Brillert، نويسنده , , Christof and Fuchs، نويسنده , , Harald، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
7
From page
335
To page
341
Abstract
A sum-frequency microscope is described which provides chemically and conformationally resolved infrared information with the spatial resolution limit of a visible light microscope. The interface-specific remote sensing technique provides quantitative information on the order and orientation of the functional molecular groups at the interface.
Keywords
Second-harmonic microscope , Sum-frequency microscope , Surface order and symmetry
Journal title
Materials Science and Engineering C
Serial Year
1999
Journal title
Materials Science and Engineering C
Record number
2095465
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