Author/Authors :
Wu، نويسنده , , Guangming and Wang، نويسنده , , Jue and Shen، نويسنده , , Jun and Yang، نويسنده , , Tianhe and Zhang، نويسنده , , Qinyuan and Zhou، نويسنده , , Bin and DENG، نويسنده , , Zhongsheng and Fan، نويسنده , , Bin and Zhou، نويسنده , , Dongping and Zhang، نويسنده , , Fengshan، نويسنده ,
Abstract :
To control structure of nano-porous silica films effectively, a base/acid two-step catalytic sol-gel process was investigated. The nano-porous structure and IR absorption of the thin films were characterized by means of FE-SEM, AFM, SEM, FTIR, and ellipsometry, respectively. The experimental results have shown that the base/acid two-step catalysis can adjust the refractive index of the films from 1.18 to 1.41 rapidly and continuously. With a change of the experimental conditions, the frequency shift of the ω4 (TO3) peak of FTIR absorption to a lower wave number indicates a decrease in the average Si-O-Si bridging angle. A reduction of FWHM of the ω4 peak reveals a narrow distribution of the Si-O-Si bridging angle. These results suggest that influence of the experimental conditions on the FTIR absorption of the nano-porous silica films is attributed to a change of silica particle shape and state of aggregation of the particles in the films.
Keywords :
A. Nanostructures , A. Thin films , B. sol-gel chemistry , A. Oxides