• Title of article

    An analysis of intermetallics formation of gold and copper ball bonding on thermal aging

  • Author/Authors

    Murali، نويسنده , , S and Srikanth، نويسنده , , Charles J. Vath III، نويسنده , , Charles J، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    10
  • From page
    637
  • To page
    646
  • Abstract
    In IC packages, thermosonic wire bonding is the preferred method for making electrical connections between the die pad and lead frame. These interconnect are made using fine metal wires. On thermal aging (under 175 °C for 5 h) gold aluminide easily forms in gold ball bonds while formation of intermetallic compound is absent in case of copper ball bonds. An analysis of the atomic property of the elements bonded explains that atomic radii and electronegativity factors favor gold aluminide formation.
  • Keywords
    Semiconductors , Intermetallic compounds , diffusion , microstructure
  • Journal title
    Materials Research Bulletin
  • Serial Year
    2003
  • Journal title
    Materials Research Bulletin
  • Record number

    2096200