• Title of article

    Structural order and stability of phospho(silico)molybdate and tungstophosphate Langmuir-Blodgett multilayers

  • Author/Authors

    Giannini، نويسنده , , C. and Tapfer، نويسنده , , L. and Burghard، نويسنده , , M. and Roth، نويسنده , , S.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1998
  • Pages
    4
  • From page
    179
  • To page
    182
  • Abstract
    In the present paper we report on a structural study of alkylic long-chain ammonium salt of 12-phosphomolybdate (PMo12O403−), 12-silicomolybdate (SiMo12O403=, and 12-tungstophosphate (PW12O403−) Langmuir-Blodgett (LB) multilayers by using X-ray specular, off-specular reflectivity and diffuse scattering measurements. The structural ordering of the multilayers is investigated as a function of the metal oxide anions used in the synthesis of the LB films. In particular, the specular and off-specular X-ray reflectivity measurements allow us to analyze the molecular packing along the growth direction, while the in-plane arrangement is obtained by the X-ray diffuse scattering analyses. All the samples were measured within a few days after the synthesis and again two months after growth in order to study the structural stability as a function of time. nificant differences are found by comparing PMo12O403− and SiMo12O403− films. Both compounds show highly correlated interfaces, uniform thickness and a pronounced ordering along the growth direction. However, the structural quality of both compounds deteriorate with time, demonstrating a quite unstable molecular structure. On the contrary, the PW12O403− LB multilayer does not show any structural transformation in time. Nevertheless, this LB film reveals a lower degree of vertical correlation among the interfaces and a less pronounced ordering along the growth direction.
  • Keywords
    structural stability , Langmuir-Blodgett multilayers , X-ray diffuse scattering analysis , Tungstophosphate and phospho (silico) molybdate LB multilayers
  • Journal title
    Materials Science and Engineering C
  • Serial Year
    1998
  • Journal title
    Materials Science and Engineering C
  • Record number

    2097002