Title of article
Oxygen treatment effects on properties of MgO thin films grown on single-crystalline diamond (1 0 0)
Author/Authors
Lee، نويسنده , , Seungmock and Ito، نويسنده , , Toshimichi، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
11
From page
951
To page
961
Abstract
Oxygen post-treatment effects on the electronic structure and electrical properties of MgO films grown on homoepitaxial single-crystalline (1 0 0) diamond have been studied. MgO films examined were deposited at room temperature (RT) using an electron beam evaporator and were subsequently either annealed at 573–773 K for 12 h in oxygen ambient or treated by O2 plasma for 10–40 min. RT resistivities remarkably increased after the O2 annealing and plasma treatment, indicating that the post treatments play an essential part on the formation and positioning of bandgap states. Cathodoluminescence (CL) spectra had a broad band feature in a wavelength region from 360 to 530 nm, which were decomposed to several peaks originating mainly from the oxygen-vacancy-related F and F+ centers and the interstitial vacancies of MgO film. A prominent rectifying behavior of I–V property was observed for a Au/MgO/p-diamond layered structure. Based on temperature dependences of the electrical properties in a temperature region from RT to 600 K, the electrical conduction mechanism in the MgO films is discussed in relation to polaron-related conduction as well as the ionic conduction.
Keywords
A. Electronic materials , A. Oxides , D. Electrical properties , D. Defects , D. Luminescence
Journal title
Materials Research Bulletin
Serial Year
2005
Journal title
Materials Research Bulletin
Record number
2097145
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