Title of article :
Self-organized semiconductor nanostructures: shape, strain and composition
Author/Authors :
Stangl، نويسنده , , J. and Hol، نويسنده , , V. and Springholz، نويسنده , , G. and Bauer، نويسنده , , G. and Kegel، نويسنده , , Dorothea I. and Metzger، نويسنده , , T.H.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Abstract :
An overview on various X-ray scattering and diffraction techniques is presented, from which information on the shape and size of quantum dots and wires, their composition and strain state can be obtained. These methods are described and applied to studies of InAs, PbSe and Ge-based nanostructures.
Keywords :
Quantum dots and islands , Grazing incidence diffraction , X-ray diffraction , GISAXS
Journal title :
Materials Science and Engineering C
Journal title :
Materials Science and Engineering C
