• Title of article

    Annealing effect on the photoluminescence of Si nanocrystallites thin films

  • Author/Authors

    Jeon، نويسنده , , Kyung-Ah and Kim، نويسنده , , Jong Hoon and Choi، نويسنده , , Jin Baek and Han، نويسنده , , Kyoung Bo and Lee، نويسنده , , Sang Yeol، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    3
  • From page
    1017
  • To page
    1019
  • Abstract
    Si nanocrystallites thin films on p-type (100) Si substrate have been fabricated by pulsed laser deposition (PLD) using a Nd:YAG laser. deposition, samples were annealed in several environmental gases at the temperature range from 400 to 800 °C. Strong violet-indigo photoluminescence has been observed at room temperature (RT) from nitrogen ambient-annealed Si nanocrystallites. The variation of photoluminescence (PL) properties of Si nanocrystallites thin films has been investigated depending on annealing temperatures. As the results of PL and high-resolution transmission electron microscope (HRTEM) measurements, we could suggest that the origin of violet-indigo PL from the films was related to the quantum size effect of Si nanocrystallites.
  • Keywords
    Si nanocrystallites , pulsed laser deposition , Annealing effect , Defect centers , Quantum confinement effect
  • Journal title
    Materials Science and Engineering C
  • Serial Year
    2003
  • Journal title
    Materials Science and Engineering C
  • Record number

    2098216