Title of article :
Growth and characterization of Fe3O4 films
Author/Authors :
Ding، نويسنده , , Jian and Zhang، نويسنده , , Di and Arita، نويسنده , , Makoto and Ikoma، نويسنده , , Yoshifumi and Nakamura، نويسنده , , Kazuki and Saito، نويسنده , , Katsuhiko and Guo، نويسنده , , Qixin، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2011
Pages :
5
From page :
2212
To page :
2216
Abstract :
Iron oxide films were grown on sapphire substrates by pulsed laser deposition at substrate temperatures between 100 and 700 °C. X-ray diffraction, Raman spectroscopy, and vibrational sample magnetometer analysis revealed that structural and magnetic properties of the iron oxide films strongly depend on the substrate temperature during growth. Single phase Fe3O4 film was successfully grown on sapphire substrate at a substrate temperature of 500 °C. The saturation magnetic moment of the single phase Fe3O4 film is 499 emu/cm3, which is in good agreement with the value reported for bulk magnetite, suggesting the Fe3O4 film is of high crystal quality without antiphase boundaries.
Keywords :
electronic materials , Laser deposition , Raman spectroscopy , Magnetic properties
Journal title :
Materials Research Bulletin
Serial Year :
2011
Journal title :
Materials Research Bulletin
Record number :
2101332
Link To Document :
بازگشت