مرکز منطقه ای اطلاع رساني علوم و فناوري - Successive pattern classification based on test feature classifier and its application to defect image classification

Title of article :

Successive pattern classification based on test feature classifier and its application to defect image classification

Author/Authors :

Yukinobu Sakata، نويسنده , , Shuni’chi Kaneko، نويسنده , , Yuji Takagi، نويسنده , , Hirohito Okuda، نويسنده ,

Issue Information :

روزنامه با شماره پیاپی سال 2005

Pages :

From page :

1847

To page :

1856

Keywords :

Successive learning , Defect image , Classification , Test feature classifier

Journal title :

PATTERN RECOGNITION

Serial Year :

2005

Journal title :

PATTERN RECOGNITION

Record number :

210143

Link To Document :