Title of article
Low-temperature (210 °C) deposition of crystalline germanium via in situ disproportionation of GeI2
Author/Authors
Restrepo، نويسنده , , David T. and Lynch، نويسنده , , Kristen E. and Giesler، نويسنده , , Kyle and Kuebler، نويسنده , , Stephen M. and Blair، نويسنده , , Richar G.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2012
Pages
5
From page
3484
To page
3488
Abstract
A new approach is reported for depositing crystalline germanium films. The deposition occurs at low temperatures (210–260 °C) via in situ disproportionation of GeI2 and is thereby useful for depositing Ge onto a wide range of surfaces. Deposition onto glass and polymer substrates is demonstrated. The rate of deposition onto glass is found to be 25 ng min−1. New synthetic routes to GeI2, GeI4, and Cu3Ge are also reported. These are valuable precursors for the synthesis of germanium nanostructures and organo-germanium compounds.
Keywords
B. vapor deposition , A. halides , A. Inorganic compound , C. X-ray diffraction , A. Semiconductors
Journal title
Materials Research Bulletin
Serial Year
2012
Journal title
Materials Research Bulletin
Record number
2102620
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