Title of article :
Low-temperature (210 °C) deposition of crystalline germanium via in situ disproportionation of GeI2
Author/Authors :
Restrepo، نويسنده , , David T. and Lynch، نويسنده , , Kristen E. and Giesler، نويسنده , , Kyle and Kuebler، نويسنده , , Stephen M. and Blair، نويسنده , , Richar G.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2012
Abstract :
A new approach is reported for depositing crystalline germanium films. The deposition occurs at low temperatures (210–260 °C) via in situ disproportionation of GeI2 and is thereby useful for depositing Ge onto a wide range of surfaces. Deposition onto glass and polymer substrates is demonstrated. The rate of deposition onto glass is found to be 25 ng min−1. New synthetic routes to GeI2, GeI4, and Cu3Ge are also reported. These are valuable precursors for the synthesis of germanium nanostructures and organo-germanium compounds.
Keywords :
B. vapor deposition , A. halides , A. Inorganic compound , C. X-ray diffraction , A. Semiconductors
Journal title :
Materials Research Bulletin
Journal title :
Materials Research Bulletin