• Title of article

    Low-temperature (210 °C) deposition of crystalline germanium via in situ disproportionation of GeI2

  • Author/Authors

    Restrepo، نويسنده , , David T. and Lynch، نويسنده , , Kristen E. and Giesler، نويسنده , , Kyle and Kuebler، نويسنده , , Stephen M. and Blair، نويسنده , , Richar G.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2012
  • Pages
    5
  • From page
    3484
  • To page
    3488
  • Abstract
    A new approach is reported for depositing crystalline germanium films. The deposition occurs at low temperatures (210–260 °C) via in situ disproportionation of GeI2 and is thereby useful for depositing Ge onto a wide range of surfaces. Deposition onto glass and polymer substrates is demonstrated. The rate of deposition onto glass is found to be 25 ng min−1. New synthetic routes to GeI2, GeI4, and Cu3Ge are also reported. These are valuable precursors for the synthesis of germanium nanostructures and organo-germanium compounds.
  • Keywords
    B. vapor deposition , A. halides , A. Inorganic compound , C. X-ray diffraction , A. Semiconductors
  • Journal title
    Materials Research Bulletin
  • Serial Year
    2012
  • Journal title
    Materials Research Bulletin
  • Record number

    2102620