Determination of thermal and electronic carrier transport properties of SnS thinfilms using photothermal beam deflection technique

Photothermal beam deflection technique is an efficient tool for non-destructive evaluation of thin films. Thin films of tin mono sulphide, which find application as absorber layer in photovoltaic cells, were deposited by chemical spray pyrolysis technique and their carrier transport properties were determined using photothermal beam deflection technique. Thermal diffusivity, minority carrier lifetime, mobility and surface recombination velocity of these films fabricated under different spray conditions like varying spray rate, Sn/S ratio and substrate temperature were determined. Photothermal beam deflection technique was also employed for constructing the thermal images of these films to evaluate the film uniformity.