Title of article
Extending the relevant component analysis algorithm for metric learning using both positive and negative equivalence constraints
Author/Authors
Dit-Yan Yeung، نويسنده , , n Hong Chang، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2006
Pages
4
From page
1007
To page
1010
Keywords
Metric learning , Mahalanobis metric , Semi-supervised learning
Journal title
PATTERN RECOGNITION
Serial Year
2006
Journal title
PATTERN RECOGNITION
Record number
210310
Link To Document