• Title of article

    Effect of annealing temperature on the supercapacitor behaviour of β-V2O5 thin films

  • Author/Authors

    Jeyalakshmi، نويسنده , , K. P. Vijayakumar، نويسنده , , S. and Nagamuthu، نويسنده , , S. and Muralidharan، نويسنده , , G.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2013
  • Pages
    7
  • From page
    760
  • To page
    766
  • Abstract
    Vanadium pentoxide thin films are prepared via sol–gel spin coating method. The films coated on FTO and glass substrates are treated at different temperatures ranging from 250 °C to 400 °C. The structural, optical and electrochemical investigations are made. X-ray diffraction analysis shows the film to be composed of V2O5 in β-phase up to annealing temperature of 350 °C and at 400 °C the structural transformation to α-phase is observed. FTIR spectrum shows the formation of VO bond. The SEM images reveal the formation of nanopores. Optical absorption studies indicate a band gap of 2.2–2.4 eV. The supercapacitor behaviour is studied using cyclic voltammetery technique and electrochemical impedance analysis. The vanadium pentoxide films annealed at 300 °C for an hour exhibits a maximum specific capacitance of 346 F g−1 at a scan rate of 5 mV s−1.
  • Keywords
    C. Impedance spectroscopy , A. Thin films , B. Sol–gel chemistry , C. electrochemical measurements
  • Journal title
    Materials Research Bulletin
  • Serial Year
    2013
  • Journal title
    Materials Research Bulletin
  • Record number

    2103192