Title of article :
Investigation of structural, optical, electrical and dielectric properties of catalytic sprayed hausmannite thin film
Author/Authors :
Larbi، نويسنده , , T. and Ouni، نويسنده , , B. and Boukhachem، نويسنده , , A. and Boubaker، نويسنده , , K. and Amlouk، نويسنده , , M.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2014
Pages :
10
From page :
457
To page :
466
Abstract :
Hausmannite Mn3O4 thin film have been synthesized using spray pyrolysis method. These films are characterized using X-ray diffraction (XRD), atomic force microscope AFM, UV–vis–NIR spectroscopy and impedance spectroscopy. XRD study confirms the tetragonal structure of the as-deposited films with lattice parameters, a = 5.1822 Å and c = 9.4563 Å and a grain size of about 56 nm. UV–vis–NIR spectroscopy was further used to estimate optical constants such as extinction coefficient, refractive index, band gap and Urbach energy. Moreover, impedance spectroscopy analysis was employed to estimate electrical and dielectrical properties of the sprayed thin films. The activation energy values deduced from DC conductivity and relaxation frequency were almost the same, revealing that the transport phenomena is thermally activated by hopping between localized states. The AC conductivity is found to be proportional to ωs. The temperature dependence of the AC conductivity and the frequency exponent, s was reasonably well interpreted in terms of the correlated barrier-hopping CBH model. The dielectric properties were sensitive to temperature and frequency. The study of the electrical modulus indicated that the charge carrier was localized. Experimental results concerning optical constants as Urbach energy, dielectric constant, electric modulus and AC and DC conductivity were discussed in terms of the hopping model as suggested by Elliott.
Keywords :
oxides , Semiconductors , Thin films , epitaxial growth , crystal structure , X-ray diffraction
Journal title :
Materials Research Bulletin
Serial Year :
2014
Journal title :
Materials Research Bulletin
Record number :
2105819
Link To Document :
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