Author/Authors :
Walker، نويسنده , , R. and Gurary، نويسنده , , A.I. and Yuan، نويسنده , , C. H. Zawadzki، نويسنده , , P. and Moy، نويسنده , , K. and Salagaj، نويسنده , , T. and Thompson، نويسنده , , A.G. and Krolla، نويسنده , , W.J. and Stall، نويسنده , , R.A. and Schumaker، نويسنده , , N.E.، نويسنده ,
Abstract :
In the past several years developments in epitaxial growth of GaN have made this material varible for device applications such as UV and blue-light-emitting diodes and short-wavelength lasers in optical memory. At the same time, metal organic vapor-phase epitaxial growth of GaN presents several technical challenges including high growth temperatures (in the range of 1100 °C), a small process parameter window, and strict requirements for highly uniform flow and temperature distribution over the area of deposition. Finite element analysis thermal modeling in combination with a novel experimental technique for real-time thermal mapping of the rotating wafer under actual deposition parameters was used for the development of a multizone heating system that provided temperature uniformity better than 3.3 °C for a 50 mm wafer at a deposition temperature of 1050 °C. Computational flow modeling was also used during design optimization. High flow and temperature uniformity provided by a new metal organic vapor-phase epitaxy rotating-disk reactor allowed us to deposit GaN films with very good surface morphology (roughness less than 100 إ) and with thickness uniformity to less than 2% across 50 mm wafers.