Title of article :
Cathodoluminescence study of GaN epitaxial layers
Author/Authors :
Cremades، نويسنده , , A. and Piqueras، نويسنده , , Lisette J. C. Xavier and James J. Germida ، نويسنده , , C. and Monteiro، نويسنده , , T. and Pereira، نويسنده , , E. and Meyer، نويسنده , , B.K. and Hofmann، نويسنده , , D.M. and Fischer، نويسنده , , S.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1996
Pages :
5
From page :
230
To page :
234
Abstract :
GaN epitaxial layers have been investigated by cathodoluminescence (CL) in the scanning electron microscope (SEM). The most prominent feature of the spectra is a complex band at 2.2 eV, whose evolution with temperature and excitation density suggests emission mechanisms involving a deep center and donor-donor or donor-acceptor pairs. Time resolved photoluminescence (TRPL) measurements confirm the involvement of a deep center in the emission. CL images reveal that the centers responsible for this emission decorate grain boundaries. Emission bands at 2.87 eV and 1.31 eV have been also detected in the films.
Keywords :
Photoluminescence , Scanning electron microscopy , cathodoluminescence
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
1996
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2131933
Link To Document :
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