Title of article :
Dipolar interactions between unpaired Si bonds at the (111)Si/SiO2 interface
Author/Authors :
Stesmans، نويسنده , , A. and Nouwen، نويسنده , , B.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
4
From page :
52
To page :
55
Abstract :
Direct experimental evidence for the dipolar interactions within the two-dimensional Pb defect system at the Si/SiO2 interface is provided by the observation of anisotropy in the electron spin resonance spectra. This observation was enabled through distinct interface degradation by post-oxidation annealing in H2, leading to enhanced Pb density. The data are interpreted within the framework of a computational model based on the magnetostatic approximation of the local field. The results suggest Pb defects to exhibit a self-avoiding behaviour and confirm their occurrence as related to the release of interface stress.
Keywords :
Si/SiO2 interface , electron spin resonance , dipolar interaction , Defects
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
1999
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2133739
Link To Document :
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