Title of article :
Self-organization as a means to suppress and control defect formation in silicon
Author/Authors :
Gubenko، نويسنده , , Anatolii Ya.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
4
From page :
100
To page :
103
Abstract :
It was established that in any phase changes in Si (realized by self-organization), there arises an oscillating sequence of specific microstates. Along ascending and descending branches of the oscillations, the concentrations of thermal donors (TDs) and other defects change in the opposite directions with changes in the parameters of state. This feature of self-organization makes it possible to obtain silicon with low densities of defects.
Keywords :
Defects , Experiment , self-organization , Silicon
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
1999
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2133761
Link To Document :
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