Title of article
The influence of MOCVD process scheme on the optical properties of GaN layers
Author/Authors
Ciorga، نويسنده , , M and Bryja، نويسنده , , L and Misiewicz، نويسنده , , J and Paszkiewicz، نويسنده , , R and Korbutowicz، نويسنده , , R and Panek، نويسنده , , M and Paszkiewicz، نويسنده , , B and T?acza?a، نويسنده , , M، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
4
From page
16
To page
19
Abstract
The GaN layers were grown on sapphire substrates using atmospheric pressure MOCVD system. The new process scheme was developed to improve the quality of epitaxial layers. Additional buffer layers, grown with increasing temperature and increasing V/III ratio, were inserted between the low temperature buffer layer and the high temperature GaN overlayer grown on it. The influence of growth conditions on luminescence properties of GaN layers, especially the yellow emission, was investigated.
Keywords
GaN compounds , yellow emission , Photoluminescence (PL) , MOCVD growth technology
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
1999
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2133849
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