• Title of article

    The influence of MOCVD process scheme on the optical properties of GaN layers

  • Author/Authors

    Ciorga، نويسنده , , M and Bryja، نويسنده , , L and Misiewicz، نويسنده , , J and Paszkiewicz، نويسنده , , R and Korbutowicz، نويسنده , , R and Panek، نويسنده , , M and Paszkiewicz، نويسنده , , B and T?acza?a، نويسنده , , M، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1999
  • Pages
    4
  • From page
    16
  • To page
    19
  • Abstract
    The GaN layers were grown on sapphire substrates using atmospheric pressure MOCVD system. The new process scheme was developed to improve the quality of epitaxial layers. Additional buffer layers, grown with increasing temperature and increasing V/III ratio, were inserted between the low temperature buffer layer and the high temperature GaN overlayer grown on it. The influence of growth conditions on luminescence properties of GaN layers, especially the yellow emission, was investigated.
  • Keywords
    GaN compounds , yellow emission , Photoluminescence (PL) , MOCVD growth technology
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: B
  • Serial Year
    1999
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: B
  • Record number

    2133849