Title of article
Liquid phase epitaxy of films with langasite structure
Author/Authors
Chani، نويسنده , , Valery I and Takeda، نويسنده , , Hiroaki and Fukuda، نويسنده , , Tsuguo، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1999
Pages
5
From page
212
To page
216
Abstract
Epitaxial films of Na2CaGe6O14 with langasite structure were deposited by liquid phase epitaxy (LPE) technique on isomorphic Nd3Ga5SiO14 substrates at a growth temperature of about 1000°C using K2O–V2O5 based flux. The films were about 100 μm in thickness and had rough surface morphology. The film composition measurements were made by scanning electron-probe microanalysis (EPMA). EPMA data indicated low content of flux forming K+ and V5+ cations in the films grown. Ca2+ enrichment and Na+ decrease were detected in the vicinity of film/substrate interfaces.
Keywords
Piezoelectric , Langasite , Film , liquid phase epitaxy , flux , Segregation
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
1999
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2134045
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