Title of article :
Integrated photometer with porous silicon interference filters
Author/Authors :
Veit and Hunkel، نويسنده , , D and Marso، نويسنده , , M and Butz، نويسنده , , M and Arens-Fischer، نويسنده , , R and Lüth، نويسنده , , H، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
4
From page :
100
To page :
103
Abstract :
Porous silicon transmission interference filters with laterally varying transmission wavelengths are used to manufacture a photometer. Because of the linear varying transmission characteristic of the filter it is possible to measure, beyond small regions of the porous layer, the correlated spectral photo current. It is therefore necessary to bring up a series of ohmic metal contacts along the porous filter. Between two neighbouring contacts one can measure the spectral photo current of the transmission wavelength at this specific point of the surface. By measuring multiple pairs of contacts, the whole spectrum between 400 and 1100 nm wavelength can be recorded. First results of the resolution capability and sensitivity are demonstrated.
Keywords :
Porous silicon , Lateral gradient , Photometer , Fabry-Perot
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
2000
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2134832
Link To Document :
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