Title of article
Do we really understand dislocations in semiconductors?
Author/Authors
Jones، نويسنده , , R.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2000
Pages
6
From page
24
To page
29
Abstract
The properties of dislocations in Si, GaAs and GaN are reviewed. Although, theoretical investigations favour a reconstruction eliminating, or reducing, the electrical activity in each case, with a consequent increase in the barrier for dislocation motion, there are problems in reconciling these results with experiment. It may be that the influence of impurities or point defects cannot be overlooked.
Keywords
Impurities , ? Dislocation , Silicon
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2000
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2135125
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