Title of article :
Do we really understand dislocations in semiconductors?
Author/Authors :
Jones، نويسنده , , R.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2000
Pages :
6
From page :
24
To page :
29
Abstract :
The properties of dislocations in Si, GaAs and GaN are reviewed. Although, theoretical investigations favour a reconstruction eliminating, or reducing, the electrical activity in each case, with a consequent increase in the barrier for dislocation motion, there are problems in reconciling these results with experiment. It may be that the influence of impurities or point defects cannot be overlooked.
Keywords :
Impurities , ? Dislocation , Silicon
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
2000
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2135125
Link To Document :
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