Influence of surface deformation upon the properties of Cu-contacts on CdTe single crystals

Cu∼–p-CdTe contacts formed by deposition of Cu film on a mechanically polished (001) surface of p-CdTe single crystal exhibit rectification property, contrary to ohmic property of Cu–p-CdTe contacts on the chemically polished surface of p-CdTe. The height barrier is estimated assuming that it is caused by the distortion band structure at the CdTe surface. The distortion is created by mechanical treatment and is a result of a local tensions which exceeds macroscopic limit of the CdTe elasticity (4×109 Pa). A model of the effect is proposed. The calculated magnitude height barrier 1.9 eV agrees well with experimental data.