Title of article :
Field ion microscopy study of CO oxidation on palladium field emitter: field effects and imaging mechanism
Author/Authors :
Hammoudeh، نويسنده , , A and Naschitzki، نويسنده , , M، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1999
Pages :
5
From page :
89
To page :
93
Abstract :
Field ion microscopy (FIM) was applied in an attempt to monitor the kinetic oscillations in the CO oxidation rate. However, major difficulties arise due to field effects that enhance the CO dissociation leading to rapid poisoning of the surface with the formed carbon. On the other hand, it was found that the ionization of molecular oxygen that acts as the imaging gas under reaction conditions, occurs preferentially on oxygen adsorption sites in agreement with the mechanism of resonant field ionization. The imaging mechanism based on local work function influences on field ionization efficiency was discussed in view of the data obtained and was shown to be incorrect.
Keywords :
CO oxidation , PALLADIUM , Field effect
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Serial Year :
1999
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Record number :
2135612
Link To Document :
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