• Title of article

    Optical constants of vacuum-evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry

  • Author/Authors

    Senthil، نويسنده , , K and Mangalaraj، نويسنده , , D and Narayandass، نويسنده , , Sa.K and Adachi، نويسنده , , Sadao، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2000
  • Pages
    6
  • From page
    53
  • To page
    58
  • Abstract
    Optical constants of vacuum-evaporated CdS thin film have been determined by spectroscopic ellipsometry in the photon energy range from 1.2 to 5.5 eV at room temperature. The dielectric constant values were found to be substantially lower than those for the bulk CdS. The optical constants of the film were also determined using the optical transmittance measurements and the results were discussed.
  • Keywords
    Optical constants , CDS , spectroscopic ellipsometry , Vacuum Evaporation , Refractive index , optical absorption
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: B
  • Serial Year
    2000
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: B
  • Record number

    2136264

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=2136264