Optical constants of vacuum-evaporated cadmium sulphide thin films measured by spectroscopic ellipsometry

Optical constants of vacuum-evaporated CdS thin film have been determined by spectroscopic ellipsometry in the photon energy range from 1.2 to 5.5 eV at room temperature. The dielectric constant values were found to be substantially lower than those for the bulk CdS. The optical constants of the film were also determined using the optical transmittance measurements and the results were discussed.