Grazing-incidence small-angle X-ray scattering on nanosized vanadium oxide and V/Ce oxide films

Vanadium oxide and new V/Ce oxide films on glass substrate were obtained by sol–gel dip-coating process. The average grain radius, 〈R〉, obtained by grazing-incidence small-angle X-ray scattering for pure V2O5 was 7.49±1.06 nm. The average grain size 〈R〉 for mixed oxides depends on the atomic percent of V in the sample. The fractal nature of some of these samples is analyzed.