Title of article :
P-type InP grown by liquid phase epitaxy with rare earths: not intentional Ge acceptor doping
Author/Authors :
Zdلnsk‎، نويسنده , , K. and Zavadil، نويسنده , , J. and Prochلzkovل، نويسنده , , O. and Gladkov، نويسنده , , P.، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2001
Pages :
4
From page :
10
To page :
13
Abstract :
InP single crystal layers were grown by liquid phase epitaxy (LPE) on semi-insulating InP:Fe substrates with praseodymium added to the melt. Room temperature Hall effect measurements revealed p-type conductivity of the layers with the hole concentration 6×1014 cm−3 and mobility 150 cm2 V−1 s−1. By measuring temperature dependence of the hole concentration the binding energy of the dominant acceptor was determined as 223 meV. A photoluminescence line was found at 1.195 eV, close to the previously estimated no-phonon line of Ge acceptor transitions in Ge doped n-type InP. It was concluded that Ge acceptors cause the p-type conductivity of the grown layers.
Keywords :
InP , GE , Rare earth , Hall effect , Photoluminescence
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Serial Year :
2001
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Record number :
2136444
Link To Document :
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