Title of article
Packaging-induced stress distribution in high power AlGaAs laser diodes by photoluminescence mapping
Author/Authors
Martin، نويسنده , , Pilar and Landesman، نويسنده , , Jean-Pierre and Bisaro، نويسنده , , Renato and Martin، نويسنده , , Esther and Fily، نويسنده , , Arnaud and Hirtz، نويسنده , , Jean Pierre، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
5
From page
188
To page
192
Abstract
The microphotoluminescence (μ-PL) technique is proposed for mapping local stress distribution in GaAs/AlGaAs high power laser diode arrays (LDAs). This technique will be used to monitor the stresses that can be induced on the bars during the packaging process. We show herein that also a detailed study of the stress profiles that could exist in the bars before mounting and after aging can be achieved with this technique.
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2001
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2136564
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