Title of article
Microstructure of rapidly solidified Al–20Si alloy powders
Author/Authors
Kim، نويسنده , , Taek-Soo and Lee، نويسنده , , Byong-Taek and Lee، نويسنده , , Chul Ro and Chun، نويسنده , , Byong-Sun، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
4
From page
617
To page
620
Abstract
Microstructural details of rapidly solidified Al–20Si alloy powders by gas atomization were examined by transmission electron microscope. The as-atomized alloy powder consists of primary and eutectic Si embedded in Al matrix. Typical sizes of Al grain, primary Si and eutectic Si measured in the powder of 40 μm in diameter are 1 μm, 3 μm and 100 nm, respectively. Twin and stacking faults were found to present in the precipitated Si. The alloy powder has semicoherently bonded interface between Al {1 1 1} and Si {1 1 1} with a specific lattice spacing.
Keywords
Crystallographic orientation , Hypereutectic Al–Si alloys , Rapid solidification
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2001
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2136821
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