Influence of current annealing, stress, torsion and dc magnetic field on Matteucci effect in amorphous wires

Influence of axial dc magnetic field and applied stress on induced Matteucci voltage in as-cast and current annealed amorphous wires has been studied. Induced Matteucci voltage shows large variations with applied axial dc magnetic field and stress, which is further influenced by current annealing with or without torsion, via anisotropy induced by current annealing. Linear variation of induced Matteucci voltage with applied axial dc field and stress is reported that can be useful especially for field and stress sensors.