Title of article
Atomic scale observation of Cottrell atmospheres in B-doped FeAl (B2) by 3D atom probe field ion microscopy
Author/Authors
Cadel، نويسنده , , E and Fraczkiewicz، نويسنده , , A and Blavette، نويسنده , , D، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
6
From page
32
To page
37
Abstract
Three-dimensional atom probe method (3DAP) coupled with field ion microscopy (FIM) was used to study the nano-scale boron segregation to dislocations in B2-ordered FeAl (40 at.% Al). A boron-rich Cottrell atmosphere near an edge 〈1 0 0〉 dislocation was imaged with atomic resolution and its chemical composition was analysed at local scale. Some macroscopic effects of boron segregation to crystal defects, which are related to the segregation phenomena, are also discussed.
Keywords
Field ion microscopy , Cottrell atmosphere , 3DAP
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2001
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2136980
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