Title of article
Defects in undoped and Mg-doped GaN and AlxGa1−xN
Author/Authors
Meyer، نويسنده , , B.K. and Hofmann، نويسنده , , D.M and Leiter، نويسنده , , F.H and Meister، نويسنده , , D and Topf، نويسنده , , M and Alves، نويسنده , , H and Romanov، نويسنده , , N، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
5
From page
77
To page
81
Abstract
We report on a quantitative identification of the shallow oxygen donor in GaN, compare the defects which are detected by optically detected magnetic resonance in the yellow and red emission bands in nominally undoped GaN, and demonstrate that independent of the doping level the microscopic structure of the Mg acceptor remains the same. There is a minor influence on the magnetic resonance parameters of Mg, which comes from a modification of the strain and changes by Mg incorporation. With increasing Al content in the AlxGa1−xN alloy the g-values become isotropic. The compensating centers are most likely vacancy-type complexes.
Keywords
AlGaN , Mg-acceptor , Deep defects , magnetic resonance
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2001
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2137015
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