Deformational twinning in CdTe crystals grown by the Bridgman method

The results of the crystal growth of cadmium telluride (CdTe) crystals by the Bridgman method are reported in the present work. A stoichiometric ratio of cadmium and tellurium in the melt as well as cadmium- and tellurium-rich melts are used in the different crystal growth experiments by the Bridgman method. The obtained large (φ 54 mm) crystals are plastically deformed. They were examined by X-ray diffraction methods. The conclusion that some of the twins in the melt grown CdTe crystals at high temperatures are due to the thermal stress is made according to the experimental findings. Some results concerning the influence of the {111}-{111} twin boundaries on the resistivity as well as the counting of low energy gamma rays characteristics are presented here also. The worsened resistivity and parameters in counting of 241Am source γ-rays are explained by the presence of structural defects in the solid state γ-ray counters.