Title of article
Measurement of the Gibbsian interfacial excess of solute at an interface of arbitrary geometry using three-dimensional atom probe microscopy
Author/Authors
Hellman، نويسنده , , Olof C and Seidman، نويسنده , , David N، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2002
Pages
5
From page
24
To page
28
Abstract
We show how the Gibbsian interfacial excess of solute can be calculated from three-dimensional atom probe data, even in the case of irregularly shaped interfaces. Standard treatments of interfacial thermodynamics implicitly define a one-dimensional geometry for an interface by assuming a planar interface. Of course, many real systems exhibit non-planar interfaces, and these treatments are difficult to apply. We show how our treatment derives from Gibbs’ original approach and how it is used to derive real thermodynamic quantities. The technique can be applied to any interfacial excess quantity.
Keywords
Interface , Segregation , Atom probe microscopy , Gibbsian excess
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Serial Year
2002
Journal title
MATERIALS SCIENCE & ENGINEERING: A
Record number
2137466
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