• Title of article

    Oxidation of NiFe(20 wt.%) thin films

  • Author/Authors

    Brückner، نويسنده , , W. and Baunack، نويسنده , , S. S. Hecker، نويسنده , , M. and Thomas، نويسنده , , J. and Groudeva-Zotova، نويسنده , , S. and Schneider، نويسنده , , C.M.، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2001
  • Pages
    4
  • From page
    272
  • To page
    275
  • Abstract
    The oxidation of sputtered NiFe(20 wt.%, Permalloy) thin films with a thickness of 180 nm was studied during annealing up to 400 °C for 2 h in air. The composition and the thickness of the oxide layer and the compositional change in the NiFe alloy layer as well as the microstructure of the film were investigated by Auger electron spectroscopy, X-ray diffraction, and transmission electron microscopy. Distinct oxidation starts at about 300 °C. The formed oxide layer consists of Fe2O3. The Fe concentration in the NiFe layer decreases with the oxidation which leads to changes of the properties of this layer.
  • Keywords
    Thin films , Oxidation , Iron , nickel , Auger electron spectroscopy , Electron microscopy
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: B
  • Serial Year
    2001
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: B
  • Record number

    2137748