Title of article
Oxidation of NiFe(20 wt.%) thin films
Author/Authors
Brückner، نويسنده , , W. and Baunack، نويسنده , , S. S. Hecker، نويسنده , , M. and Thomas، نويسنده , , J. and Groudeva-Zotova، نويسنده , , S. and Schneider، نويسنده , , C.M.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
4
From page
272
To page
275
Abstract
The oxidation of sputtered NiFe(20 wt.%, Permalloy) thin films with a thickness of 180 nm was studied during annealing up to 400 °C for 2 h in air. The composition and the thickness of the oxide layer and the compositional change in the NiFe alloy layer as well as the microstructure of the film were investigated by Auger electron spectroscopy, X-ray diffraction, and transmission electron microscopy. Distinct oxidation starts at about 300 °C. The formed oxide layer consists of Fe2O3. The Fe concentration in the NiFe layer decreases with the oxidation which leads to changes of the properties of this layer.
Keywords
Thin films , Oxidation , Iron , nickel , Auger electron spectroscopy , Electron microscopy
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2001
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2137748
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