Title of article :
MBE source for germanium–carbon co-evaporation
Author/Authors :
Oehme، نويسنده , , M and Bauer، نويسنده , , M and Kasper، نويسنده , , E، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2002
Abstract :
Carbon (C) doping is useful for suppression of outdiffusion from boron in SiGe-heterobipolartransistors. The typical doping range is 1019–1020 cm−3 which means a Ge–C doping ratio of 100–1000. We present a MBE source for coevaporation with a flux ratio Ge–C of roughly 1000. This source consists of a specially designed carbon crucible with molten Ge which is thermally treated for a long time at 1000 °C. At the operation temperature (1300 °C) both the Ge-melt and the dissolved C evaporate. The Ge-flux is controlled by a quadrupole mass spectrometer with closed loop feedback. Ge and C profiles in different SiGe structures were measured by secondary ion mass spectrometry. A codoping of C–Ge with a 1/1000 doping level ratio was proven. The main problem with long term operation of the cell is connected to the build up of a carbon skin on the Ge melt.
Keywords :
Molecular beam epitaxy (MBE) , Effusion cell , Germanium carbon coevaporation
Journal title :
MATERIALS SCIENCE & ENGINEERING: B
Journal title :
MATERIALS SCIENCE & ENGINEERING: B