Preparation of 4:55:45 samarium doped PZT films by sol-gel technique and their characterization

Thin ferroelectric films of samarium doped PZT (4:55:45) were prepared by sol-gel technique on ITO coated corning 7059 glass. Characterization of these films by X-ray diffraction and scanning electron microscopy shows that the films are formed perovskite tetragonal phase with submicron crystallite size. Charge field hysteresis, dielectric relaxation and pyroelectric studies were carried on these films. It is concluded that these films with their high pyroelectric coefficient ∼45 nC cm−2 K−1 and low dielectric constant ∼230 will find application as pyroelectric sensor elements.