• Title of article

    Quantum effects and single-electron charging effects in nano-scale silicon MOSFETs at room temperature

  • Author/Authors

    Hiramoto، نويسنده , , Toshiro and Majima، نويسنده , , Hideaki and Saitoh، نويسنده , , Masumi، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    4
  • From page
    24
  • To page
    27
  • Abstract
    Two types of extremely small MOSFETs in the 10 nanometer scale have been successfully fabricated and their transport properties are characterized mainly at room temperature. Both quantum confinement effects and single-electron charging effects are clearly observed. In ultra-narrow channel MOSFETs, the increase in threshold voltage owing to the quantum confinement effect is observed, and the mobility enhancement owing to anisotropic electron mass is also discussed. In extremely narrow point-contact MOSFETs, large Coulomb blockade oscillations are observed at room temperature, and two types of negative differential conductance are found at low temperatures. These results strongly suggest that the quantum and single-electron effects should be precisely modeled and incorporated in the design of nano-scale MOSFETs.
  • Keywords
    Nanoelectronics , Silicon nanotechnology , Quantum effect , Quantum wire , MOSFET , Quantum dot , Single Electron Transistor , Coulomb blockade
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: B
  • Serial Year
    2003
  • Journal title
    MATERIALS SCIENCE & ENGINEERING: B
  • Record number

    2139143