Er3+-doped tellurite waveguides deposited by excimer laser ablation

This paper reports on the optical properties of Erbium-doped zinc–tellurite (TeO2ZnCl2ZnO) oxyhalide glass waveguides, deposited by reactive pulsed laser deposition (RPLD) on silica substrates. Er3+-doped zinc–tellurite glass (ZT) targets were ablated in oxygen dynamical flow at two different pressure values of 5 and 10 Pa by ArF excimer laser at the fluence of 3.7 J/cm2. veguiding properties of the deposited films were investigated by the m-line technique. The TE0 mode excitation was used for photoluminescence (PL) and Raman measurements, in order to study the Erbium ion 4I13/2→4I15/2 transition and structural properties of the deposited films, respectively. Optical band gap and wavelength dependence of the real and imaginary parts of the refractive index were estimated from transmission spectra.