Author/Authors :
Yu، نويسنده , , Hsin-Chieh and Chang، نويسنده , , Shoou-Jinn and Su، نويسنده , , Yan-Kuin and Sung، نويسنده , , Chia-Pin and Lin، نويسنده , , Yu-Wei and Yang، نويسنده , , Hung-Pin and Huang، نويسنده , , Chunyuan and Wang، نويسنده , , Jin-Mei، نويسنده ,
Abstract :
A simple processing technology for oxide confined vertical-cavity surface-emitting lasers (VCSELs) fabrication is reported in this article. Results of the burn-in test up to the present-day show that the high temperature lifetime of the fabricated devices exceeded 70:00 h. The eye diagrams show that the devices can be modulated up to 10 Gbps.
Keywords :
VCSEL , L–I–V , Far field pattern , Life test
