Title of article
Study of structural, magnetic, and electrical transport properties in La1−xCuxMnO3
Author/Authors
Kar، نويسنده , , Manoranjan and Ravi، نويسنده , , S، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2004
Pages
5
From page
332
To page
336
Abstract
La1−xCuxMnO3 compounds have been prepared in single phase form for x=0–0.20. X-ray diffraction (XRD) patterns were recorded at room temperature and these could be refined using R3̄c space group by employing rietveld method. The typical lattice parameters for x=0.10 sample are a=b=5.531 Å and c=13.352 Å. dc electrical resistivity measurements were carried out below room temperature. The samples x≤0.10 exhibit metal–insulator transitions in the temperature range (TMI) 43–92 K. The resistivity data above TMI could be fitted to Mott variable range hopping (Mott-VRH) model. The samples x>0.10 could be mostly fitted to Efros–Shklovskii VRH (ES-VRH) model. Temperature variations of ac susceptibility down to 30 K were measured at an ac field amplitude of 5.3 Oe. All the above Cu doped samples exhibit paramagnetic to ferromagnetic transitions.
Keywords
oxides , Metal–insulator transitions , exchange interactions , Copper
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2004
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2141130
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