Solid state Si diffusion and joint formation involving aluminum brazing sheet

The paper provides information about the use of in situ determined diffusion coefficients of silicon for modeling of a brazed joint formation, i.e. formation of the equilibrium surface of a molten Al+xSi alloy at the onset of solidification in the joint. Diffusion coefficients of Si were determined (within both the joint and/or residue zone) to analyze its migration across the clad–core interface of an Al brazing sheet, including both the period prior to reaching brazing temperature range, and the peak brazing temperature range. Subsequently, diffusion coefficients were used to predict the joint formation during brazing. Migration of silicon is not uniform along the clad–core interface during brazing and depends, in addition to material characteristics and process parameters, on the vicinity of the joint zone. It is argued that, due to these alterations, the joint formation modeling must be performed by using in situ determined diffusion coefficients. The diffusion coefficients determined directly from electron probe microanalysis (EPMA) scans at different locations along the cladding sheet and within the joint zone differ between each other and when compared to the literature data. This variation influences the outcome of the residue formation modeling; hence the joint formation modeling may be affected. The relation between these phenomena is briefly discussed and quantitative data regarding diffusion coefficients, and in particular an approach to utilization of these data in modeling of joint formation, are provided.