A method to determine the orientation of the high-temperature beta phase from measured EBSD data for the low-temperature alpha phase in Ti-6Al-4V

A method was developed to determine the orientation of the high-temperature beta phase from measured electron-backscatter diffraction (EBSD) data for the low-temperature alpha phase in Ti-6Al-4V. This technique is an improvement over existing methods because it does not require a priori knowledge of the variant selection process and can accommodate variants from adjacent beta grains being incorporated in the data set submitted for analysis. It is a general method and therefore can be used to examine texture relationships in materials other than Ti-6Al-4V which undergo a burgers-type phase transformation.