An automated method to determine the orientation of the high-temperature beta phase from measured EBSD data for the low-temperature alpha-phase in Ti–6Al–4V

An automated method to determine the orientation of the high-temperature beta phase from measured electron-backscatter-diffraction (EBSD) data for the low-temperature alpha-phase in Ti–6Al–4V was developed to provide a solution for multiple prior-beta grains within a single data set. This technique is an improvement over existing methods because it does not require a priori knowledge of the variant selection process or the location of prior-beta grain boundaries, and it can transform an arbitrary field of EBSD data containing the variants from many prior-beta grains in a single calculation. It is a general method and therefore can be used to examine texture relationships in materials other than Ti–6Al–4V which undergo a burgers-type phase transformation.