Title of article :
Effect of peak load on the determination of hardness and Youngʹs modulus of hot-pressed Si3N4 by nanoindentation
Author/Authors :
Gong، نويسنده , , Jianghong and Miao، نويسنده , , Hezhuo and Peng، نويسنده , , Zhijian and Qi، نويسنده , , Longhao، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
6
From page :
140
To page :
145
Abstract :
The indentation load–displacement curves of a hot-pressed silicon nitride were measured under different peak load levels. The unloading segments of these curves were analyzed using the widely adopted Oliver–Pharr method. It was found that both the hardness, H, and the Youngʹs modulus, E, exhibit significant peak-load-dependence. Empirical approaches were then proposed to determine the load-independent hardness and modulus. The hardness and modulus deduced from these empirical approaches were proven to be comparable with the literature reported data measured with conventional methods.
Keywords :
Nano-indentation , ceramics , Silicon nitride , Hardness , Youngיs modulus
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Serial Year :
2003
Journal title :
MATERIALS SCIENCE & ENGINEERING: A
Record number :
2142280
Link To Document :
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