Title of article
SnO2 films: formation, electrical and optical properties
Author/Authors
Gorley، نويسنده , , P.M. and Khomyak، نويسنده , , V.V. and Bilichuk، نويسنده , , S.V. and Orletsky، نويسنده , , I.G. and Horley، نويسنده , , P.P. and Grechko، نويسنده , , V.O.، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2005
Pages
4
From page
160
To page
163
Abstract
The authors investigated the influence of technological conditions on the properties of thin films of tin dioxide (SnO2) deposited with reactive magnetron sputtering in Ar–O2 carrier gas mixture. The optimal technological regimes were determined to grow high quality films with high transparency and low specific resistivity. The possible nature of the processes taking place during film deposition and annealing is discussed. Our experiments shown that films deposited at the temperature of 473 K were characterized with lower material defect level. Further annealing of these films in the air at 700 K resulted in significant decrease of their specific resistivity (down to 1.5 × 10−3 to 6 × 10−4 Ω cm) and increase of optical transmission (up to 90–95%).
Keywords
Isothermal annealing , specific resistivity , transmission coefficient , Thin film , Reactive magnetron sputtering , Tin dioxide SnO2
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Serial Year
2005
Journal title
MATERIALS SCIENCE & ENGINEERING: B
Record number
2142573
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